March 22, 2026 - March 26, 2026
The IEEE International Reliability Physics Symposium (IRPS) stands as the premiere conference for engineers and scientists in the field of microelectronics reliability. Over its 60-year history, it has become a pivotal event where experts from around the globe gather to present groundbreaking work and delve into the physics of failure and application environments.
What to Expect:
- Engage with leading experts like Program Call and Papers Call For Papers sharing their insights.
- Explore cutting-edge tutorials and workshops designed to deepen your understanding of microelectronics reliability.
- Network with a diverse group of peers and industry leaders from the United States, Europe, Asia, and beyond.
- Access comprehensive conference proceedings and slides through the Underline site.
- Participate in interactive sessions and discussions that foster innovation and collaboration.
Focus Areas:
- Microelectronics Reliability
- Physics of Failure
- Application Environments
- Semiconductor Devices
- Integrated Circuits
Keywords: microelectronics, reliability, IEEE, semiconductor, physics of failure
Target audience:
Engineers, scientists, researchers, and industry professionals seeking to advance their knowledge in microelectronics reliability.
What attendees say:
Attendees often praise IRPS for its comprehensive coverage of microelectronics reliability, the quality of its speakers, and the opportunity to connect with a global network of peers. The event is celebrated for fostering a collaborative environment where groundbreaking ideas emerge.
Join this prestigious gathering to connect, innovate, and learn from the best in the field.
